Invention Grant
US08711601B2 Resistive random access memory cell and resistive random access memory module
有权
电阻随机存取存储单元和电阻随机存取存储器模块
- Patent Title: Resistive random access memory cell and resistive random access memory module
- Patent Title (中): 电阻随机存取存储单元和电阻随机存取存储器模块
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Application No.: US13338264Application Date: 2011-12-28
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Publication No.: US08711601B2Publication Date: 2014-04-29
- Inventor: Frederick T. Chen , Heng-Yuan Lee , Yu-Sheng Chen
- Applicant: Frederick T. Chen , Heng-Yuan Lee , Yu-Sheng Chen
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A resistive random access memory (RRAM) cell including a first electrode, a second electrode, and a plurality of repeated sets of layers is provided. Each of the sets of layers includes a resistance-changing layer, a barrier layer, and an ionic exchange layer between the resistance-changing layer and the barrier layer, wherein a thickness of each of the resistance-changing layer, the barrier layer and the ionic exchange layer exceeds a Fermi wavelength, and the thickness each of the resistance-changing layer and ionic exchange layer are less than an electron mean free path. Further, a RRAM module including the aforesaid RRAM cell and a switch is also provided.
Public/Granted literature
- US20130170278A1 RESISTIVE RANDOM ACCESS MEMORY CELL AND RESISTIVE RANDOM ACCESS MEMORY MODULE Public/Granted day:2013-07-04
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