发明授权
- 专利标题: System for calibrating an electronic lapping guide for a beveled pole in a magnetic recording transducer
- 专利标题(中): 用于校准磁记录传感器中斜面极的电子研磨导轨的系统
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申请号: US13625270申请日: 2012-09-24
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公开(公告)号: US08717709B1公开(公告)日: 2014-05-06
- 发明人: Changqing Shi , Ming Jiang
- 申请人: Western Digital (Fremont), LLC
- 申请人地址: US CA Fremont
- 专利权人: Western Digital (Fremont), LLC
- 当前专利权人: Western Digital (Fremont), LLC
- 当前专利权人地址: US CA Fremont
- 主分类号: G11B5/127
- IPC分类号: G11B5/127
摘要:
A wafer comprises a transducer having an air-bearing surface (ABS) and including a magnetic structure characterized by a desired thickness, and having a bevel and a flare point a first distance from the ABS. The wafer further comprises a first electronic lapping guide (ELG), a second ELG, and a third ELG. The first ELG has a first edge a first distance from the ABS and a second edge a second distance from the ABS. The second ELG has a third edge a third distance from the ABS and a fourth edge the second distance from the ABS. The third ELG has a fifth edge a fourth distance from the ABS and a sixth edge the second distance from the ABS. At least one of the first distance and the second distance, at least one of the third distance and the second distance, and at least one of the fourth distance and the second distance correspond to an intersection between the bevel and the desired thickness.
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