A method for determining an impact of simultaneous switching noise (SSN) for a linearly based metric is provided. The method includes generating a waveform representing an impact of SSN from a rising aggressor for each of at least two victim pins associated with the metric and generating a waveform representing an impact of SSN from a falling aggressor for each of at least two victim pins associated with the metric. The waveforms from the rising aggressor are collapsed into a single waveform for the rising aggressor and the waveforms from the falling aggressor are collapsed into a single waveform for the falling aggressor. The single waveform for the rising aggressor and the single waveform for the falling aggressor are merged into a merged waveform. Through a computing device, switching window SSN analysis of the circuit design is performed with a common uncertainty removal utilizing the merged waveform.