发明授权
- 专利标题: Laser processing apparatus,laser processing temperature measuring apparatus,laser processing method,and laser processing temperature measuring method
- 专利标题(中): 激光加工装置,激光加工温度测量装置,激光加工方法和激光加工温度测量方法
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申请号: US12591588申请日: 2009-11-24
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公开(公告)号: US08727610B2公开(公告)日: 2014-05-20
- 发明人: Satoshi Matsumoto , Tsuyoshi Kosugi
- 申请人: Satoshi Matsumoto , Tsuyoshi Kosugi
- 申请人地址: JP Hamamatsu-shi, Shizuoka
- 专利权人: Hamamatsu Photonics K.K.
- 当前专利权人: Hamamatsu Photonics K.K.
- 当前专利权人地址: JP Hamamatsu-shi, Shizuoka
- 代理机构: Drinker Biddle & Reath LLP
- 优先权: JPP2002-177652 20020618; JPP2002-177662 20020618
- 主分类号: G01J5/00
- IPC分类号: G01J5/00 ; G01N25/00 ; G01K11/06 ; H05B11/00
摘要:
The object is to provide a laser processing apparatus, a laser processing temperature measuring apparatus, a laser processing method, and a laser processing temperature measuring method which can highly accurately detect the processing temperature when carrying out processing such as welding with laser light. A laser processing apparatus 1A for processing members DR, UR to be processed by irradiating the members with laser light LB comprises a laser (semiconductor laser unit 20A) for generating the laser light LB; optical means for converging the laser light LB generated by the laser onto processing areas DA, UA; and a filter 30, disposed between the members DR, UR to be processed and the optical means, for blocking a wavelength of fluorescence generated by the optical means upon pumping with the laser light LB; wherein light having the wavelength blocked by the filter 30 is used for measuring a temperature of the processing areas DA, UA.
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