发明授权
- 专利标题: System and method for feature alignment
- 专利标题(中): 用于特征对齐的系统和方法
-
申请号: US12614301申请日: 2009-11-06
-
公开(公告)号: US08728309B2公开(公告)日: 2014-05-20
- 发明人: Xiangdong Don Li
- 申请人: Xiangdong Don Li
- 申请人地址: US CA Santa Clara
- 专利权人: Agilent Technologies, Inc.
- 当前专利权人: Agilent Technologies, Inc.
- 当前专利权人地址: US CA Santa Clara
- 主分类号: B01D15/08
- IPC分类号: B01D15/08
摘要:
In a system and method for feature alignment in chromatographic systems, the system runs a first sample through a first separation column. The system determines a first set of features for the first sample run. The system runs a second sample through a second separation column and detects a second set of features for the second sample run. The system estimates a systematic shift in features between the first sample run through the first separation column and the second sample run through the second separation column. The system adjusts the second set of features detected for the second sample run through the second separation column based on the estimated systematic shift to obtain a third set of adjusted features.
公开/授权文献
- US20100057377A1 System and Method for Feature Alignment 公开/授权日:2010-03-04
信息查询