发明授权
- 专利标题: Via structure and method thereof
- 专利标题(中): 其结构及其方法
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申请号: US13193313申请日: 2011-07-28
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公开(公告)号: US08729713B2公开(公告)日: 2014-05-20
- 发明人: Thorbjörn Ebefors , Edvard Kälvesten , Peter Agren , Niklas Svedin
- 申请人: Thorbjörn Ebefors , Edvard Kälvesten , Peter Agren , Niklas Svedin
- 申请人地址: SE Jarfalla
- 专利权人: Silex Microsystems AB
- 当前专利权人: Silex Microsystems AB
- 当前专利权人地址: SE Jarfalla
- 代理机构: Pierce Atwood LLP
- 代理商 Kevin M. Farrell
- 优先权: SE0802663-5 20081223
- 主分类号: H01L23/48
- IPC分类号: H01L23/48 ; H01L27/14 ; H01L21/30
摘要:
A vent hole precursor structure (26) in an intermediate product for a semi-conductor device has delicate structures (27, 28), and said intermediate product has a cavity (21) with a pressure therein differing from the pressure of the surroundings. The intermediate product comprises a first wafer (20) in which there is formed a depression (21). The first wafer is bonded to a second wafer (22) comprising a device layer (23) from which the structures (27, 28) are to be made by etching. A hole or groove (26) having a predefined depth extends downwards into the device layer, such that the cavity (21) during etching is opened up before the etching procedure breaks through the device layer (23) to form the structures (27, 28).
公开/授权文献
- US20120018852A1 VIA STRUCTURE AND METHOD THEREOF 公开/授权日:2012-01-26
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