发明授权
- 专利标题: Refractometry system and method
- 专利标题(中): 折射系统和方法
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申请号: US13936297申请日: 2013-07-08
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公开(公告)号: US08730462B2公开(公告)日: 2014-05-20
- 发明人: Jeff Wagner
- 申请人: Rudolph Research Analytical Inc.
- 申请人地址: US NJ Hackettstown
- 专利权人: Rudolph Research Analytical
- 当前专利权人: Rudolph Research Analytical
- 当前专利权人地址: US NJ Hackettstown
- 代理机构: Kaplan, Breyer, Schwarz & Ottesen, LLP
- 主分类号: G01N21/41
- IPC分类号: G01N21/41
摘要:
A critical-angle refractometer which utilizes an in image of light reflected from an optical interface with a vessel containing a sample under test to determine an optical property of the sample, sample properties are evaluated to prevent improper testing of the sample. This evaluation includes establishing reflectance information associating the amount of reflection with locations in the image; and utilizing a plurality of properties of the reflectance information to determine if the vessel contains a proper sample under test.
公开/授权文献
- US20130293875A1 REFRACTOMETRY SYSTEM AND METHOD 公开/授权日:2013-11-07
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