Invention Grant
- Patent Title: Method for measuring wear rate
- Patent Title (中): 磨损率测量方法
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Application No.: US13072847Application Date: 2011-03-28
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Publication No.: US08730482B2Publication Date: 2014-05-20
- Inventor: Tatsuo Matsudo , Chisio Koshimizu
- Applicant: Tatsuo Matsudo , Chisio Koshimizu
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2010-075631 20100329
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
A wear rate measurement method includes thermally coupling a focus ring having a top surface and a bottom surface with a reference piece having a bottom surface facing a susceptor and a top surface facing the focus ring; measuring a first optical path length of a low-coherence light beam that travels forward and backward within the focus ring by irradiating the low-coherence light beam to the focus ring orthogonally to the top surface and the bottom surface thereof; measuring a second optical path length of a low-coherence light beam that travels forward and backward within the reference piece by irradiating the low-coherence light beam to the reference piece orthogonally to the top surface and the bottom surface thereof; and calculating a wear rate of the focus ring based on a ratio between the first optical path length and the second optical path length.
Public/Granted literature
- US20110235056A1 METHOD FOR MEASURING WEAR RATE Public/Granted day:2011-09-29
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