Invention Grant
- Patent Title: Image force microscopy of molecular resonance
- Patent Title (中): 图像力显微镜分子共振
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Application No.: US13816726Application Date: 2011-08-11
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Publication No.: US08739311B2Publication Date: 2014-05-27
- Inventor: H. Kumar Wickramasinghe , Indrajith Rajapaksa
- Applicant: H. Kumar Wickramasinghe , Indrajith Rajapaksa
- International Application: PCT/US2011/047456 WO 20110811
- International Announcement: WO2012/021727 WO 20120216
- Main IPC: G01Q60/38
- IPC: G01Q60/38

Abstract:
A new method in microscopy is provided which extends the domain of AFM's to nanoscale spectroscopy. Molecular resonance of nanometer features can be detected and imaged purely by mechanical detection of the force gradient between the interaction of the optically driven molecular dipole/multipole and its mirror image in a Platinum coated scanning probe tip. The method is extendable to obtain nanoscale spectroscopic information ranging from infrared to UV and RF.
Public/Granted literature
- US20130283487A1 IMAGE FORCE MICROSCOPY OF MOLECULAR RESONANCE Public/Granted day:2013-10-24
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