Invention Grant
US08742386B2 Oxide based memory with a controlled oxygen vacancy conduction path
有权
具有受控氧空位传导路径的基于氧化物的存储器
- Patent Title: Oxide based memory with a controlled oxygen vacancy conduction path
- Patent Title (中): 具有受控氧空位传导路径的基于氧化物的存储器
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Application No.: US13903307Application Date: 2013-05-28
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Publication No.: US08742386B2Publication Date: 2014-06-03
- Inventor: Jun Liu , Gurtej S. Sandhu
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: H01L29/04
- IPC: H01L29/04

Abstract:
Methods, devices, and systems associated with oxide based memory can include a method of forming an oxide based memory cell. Forming an oxide based memory cell can include forming a first conductive element, forming a substoichiometric oxide over the first conductive element, forming a second conductive element over the substoichiometric oxide, and oxidizing edges of the substoichiometric oxide by subjecting the substoichiometric oxide to an oxidizing environment to define a controlled oxygen vacancy conduction path near a center of the oxide.
Public/Granted literature
- US20130292628A1 OXIDE BASED MEMORY WITH A CONTROLLED OXYGEN VACANCY CONDUCTION PATH Public/Granted day:2013-11-07
Information query
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