An eye-of-the needle (EON) pin contact is provided for being received within an electrical via that includes conductive material. The EON pin contact includes a compliant segment having two opposing spring arms and an opening defined between the spring arms. The compliant segment is configured to be received within the electrical via such that the spring arms engage the conductive material of the electrical via. A tip segment extends from the compliant segment. The tip segment is configured to be received into the electrical via before the compliant segment is received into the electrical via. The tip segment includes a broach that is configured to displace the conductive material as the tip segment is received into the electrical via to plow a path through the conductive material for reception of a corresponding one of the spring arms.