发明授权
US08754403B2 Epitaxial source/drain contacts self-aligned to gates for deposited FET channels
有权
外延源极/漏极接触件自对准到用于沉积FET通道的栅极
- 专利标题: Epitaxial source/drain contacts self-aligned to gates for deposited FET channels
- 专利标题(中): 外延源极/漏极接触件自对准到用于沉积FET通道的栅极
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申请号: US13565342申请日: 2012-08-02
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公开(公告)号: US08754403B2公开(公告)日: 2014-06-17
- 发明人: Josephine B. Chang , Paul Chang , Vijay Narayanan , Jeffrey W. Sleight
- 申请人: Josephine B. Chang , Paul Chang , Vijay Narayanan , Jeffrey W. Sleight
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Cantor Colburn LLP
- 代理商 Vazken Alexanian
- 主分类号: H01L29/06
- IPC分类号: H01L29/06
摘要:
A method of forming a self-aligned device is provided and includes depositing carbon nanotubes (CNTs) onto a crystalline dielectric substrate, isolating a portion of the crystalline dielectric substrate encompassing a location of the CNTs, forming gate dielectric and gate electrode gate stacks on the CNTs while maintaining a structural integrity thereof and forming epitaxial source and drain regions in contact with portions of the CNTs on the crystalline dielectric substrate that are exposed from the gate dielectric and gate electrode gate stacks.
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