发明授权
- 专利标题: Method for measuring flicker
- 专利标题(中): 测量闪烁的方法
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申请号: US12735411申请日: 2009-01-07
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公开(公告)号: US08755613B2公开(公告)日: 2014-06-17
- 发明人: Hua Yang , Alan Jay Stein , Gad Moshe Berger
- 申请人: Hua Yang , Alan Jay Stein , Gad Moshe Berger
- 申请人地址: FR Boulogne-Billancourt
- 专利权人: Thomson Licensing
- 当前专利权人: Thomson Licensing
- 当前专利权人地址: FR Boulogne-Billancourt
- 代理商 Robert D. Shedd; Richard LaPeruta
- 国际申请: PCT/US2009/000060 WO 20090107
- 国际公布: WO2009/091503 WO 20090723
- 主分类号: H04N5/217
- IPC分类号: H04N5/217
摘要:
A method for accurately measuring flicker, by first determining an original value based on a difference between pixel values in corresponding locations in a first picture and a second picture. Next, a reconstructed value is determined, based on a difference between pixel values in corresponding locations in a reconstruction from an encoding of the first picture and a reconstruction from an encoding of the second picture. Then, a determination is made to include a comparison value, which is determined on a difference between the reconstructed value and the original value, in a measurement of flicker between the first picture and the second picture.
公开/授权文献
- US20110052084A1 METHOD FOR MEASURING FLICKER 公开/授权日:2011-03-03
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