Invention Grant
- Patent Title: Power MOSFET structure and method
- Patent Title (中): 功率MOSFET结构及方法
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Application No.: US13609281Application Date: 2012-09-11
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Publication No.: US08759909B2Publication Date: 2014-06-24
- Inventor: Peilin Wang , Edouard D. de Fresart , Wenyi Li
- Applicant: Peilin Wang , Edouard D. de Fresart , Wenyi Li
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Charles Bergere
- Priority: CN201210236232 20120514
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
A power MOSFET includes a semiconductor substrate with an upper surface, a cavity of a first depth in the substrate whose sidewall extends to the upper surface, a dielectric liner in the cavity, a gate conductor within the dielectric liner extending to or above the upper surface, body region(s) within the substrate of a second depth, separated from the gate conductor in a lower cavity region by first portion(s) of the dielectric liner of a first thickness, and source region(s) within the body region(s) extending to a third depth that is less than the second depth. The source region(s) are separated from the gate conductor by a second portion of the dielectric liner of a second thickness at least in part greater than the first thickness. The dielectric liner has a protrusion extending laterally into the gate conductor away from the body region(s) at or less than the third depth.
Public/Granted literature
- US20130299898A1 POWER MOSFET STRUCTURE AND METHOD Public/Granted day:2013-11-14
Information query
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