Invention Grant
US08760181B2 Semiconductor system and device for identifying stacked chips and method thereof 有权
用于识别堆叠芯片的半导体系统和装置及其方法

Semiconductor system and device for identifying stacked chips and method thereof
Abstract:
A semiconductor system for identifying stacked chips includes a first semiconductor chip and a plurality of second semiconductor chips. The first semiconductor chip generates a plurality of counter codes by using an internal clock or an external input clock and transmits slave address signals and the counter codes through a through-chip via. The second semiconductor chips are given corresponding identifications (IDs) by latching the counter codes for a predetermined delay time, compare the latched counter codes with the slave address signals, and communicate data with the first semiconductor chip through the through-chip via according to the comparison result.
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