Invention Grant
- Patent Title: Memory device and method for writing therefor
- Patent Title (中): 存储器件及其写入方法
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Application No.: US13562222Application Date: 2012-07-30
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Publication No.: US08773923B2Publication Date: 2014-07-08
- Inventor: Yen-Huei Chen , Li-Wen Wang , Chih-Yu Lin
- Applicant: Yen-Huei Chen , Li-Wen Wang , Chih-Yu Lin
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman & Ham, LLP
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C7/22 ; G11C7/12

Abstract:
A method for writing a memory cell in a specific write cycle is provided. The method includes the following steps: providing a first signal having a first transition edge in the specific write cycle; providing a second signal having a second transition edge in the specific write cycle, wherein the second transition edge lags behind the first transition edge; providing a first voltage level to the memory cell; and lowering the first voltage level to a second voltage level in the specific write cycle for writing the memory cell in response to the second transition edge. A memory device is also provided.
Public/Granted literature
- US20140029358A1 MEMORY DEVICE AND METHOD FOR WRITING THEREFOR Public/Granted day:2014-01-30
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