Invention Grant
- Patent Title: Reconfigurable receiver circuits for test signal generation
- Patent Title (中): 用于测试信号产生的可重构接收器电路
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Application No.: US13787214Application Date: 2013-03-06
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Publication No.: US08774745B2Publication Date: 2014-07-08
- Inventor: Kan Lai Leung , Chiewcharn Narathong , Jianyun Hu , Yunfei Feng
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Ramin Mobarhan
- Main IPC: H04B17/00
- IPC: H04B17/00 ; H01Q11/12

Abstract:
Receiver circuits that can be reconfigured to generate test signals in a wireless device are disclosed. In an exemplary design, an apparatus includes a mixer and an amplifier. The mixer downconverts an input radio frequency (RF) signal based on a local oscillator (LO) signal in a first mode. The amplifier, which is formed by at least a portion of the mixer, amplifies the LO signal and provides an amplified LO signal in a second mode. In another exemplary design, an apparatus includes an amplifier and an attenuator. The amplifier receives and amplifies an input RF signal in a first mode. The attenuator, which is formed by at least a portion of the amplifier, receives and passes an LO signal in a second mode.
Public/Granted literature
- US20140162580A1 RECONFIGURABLE RECEIVER CIRCUITS FOR TEST SIGNAL GENERATION Public/Granted day:2014-06-12
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