Invention Grant
US08779804B2 Gate-stress test circuit without test pad 有权
没有测试垫的门应力测试电路

Gate-stress test circuit without test pad
Abstract:
A high side driver circuit includes a driver stage having an input, an output, a first power terminal and a second power terminal, a transistor having a first power terminal, a second power terminal, and a control terminal coupled to the output of the driver stage, and a switch coupled between the second power terminal of the driver stage and the second power terminal of the transistor.
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