Invention Grant
- Patent Title: Semiconductor memory device controlling operation timing of the sense circuit
- Patent Title (中): 半导体存储器件控制感测电路的操作定时
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Application No.: US13423424Application Date: 2012-03-19
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Publication No.: US08787087B2Publication Date: 2014-07-22
- Inventor: Takashi Maeda
- Applicant: Takashi Maeda
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2011-205202 20110920
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
According to one embodiment, a semiconductor memory device includes a memory cell array, a bit line, a source line, and a sense circuit. The memory cell array includes memory strings which include memory cells connected in series and stacked above a semiconductor substrate. The bit line is coupled to one of the memory strings and is capable of transferring data. The source line is coupled to one of the memory strings. When data is read, a read current flows from a bit line into the source line. The sense circuit is coupled to the bit line and senses read data. An operation timing of the sense circuit is determined on the basis of a current flowing through the source line.
Public/Granted literature
- US20130070528A1 SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2013-03-21
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