Invention Grant
- Patent Title: Nonvolatile logic array with built-in test drivers
- Patent Title (中): 具有内置测试驱动器的非易失逻辑阵列
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Application No.: US13753800Application Date: 2013-01-30
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Publication No.: US08792288B1Publication Date: 2014-07-29
- Inventor: Steven Craig Bartling , Sudhanshu Khanna
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporation
- Current Assignee: Texas Instruments Incorporation
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Frederick J. Telecky, Jr.
- Main IPC: G11C7/22
- IPC: G11C7/22 ; G11C29/08

Abstract:
A system on chip (SoC) provides a nonvolatile memory array that is configured as n rows by m columns of bit cells. Each of the bit cells is configured to store a bit of data. There are m bit lines each coupled to a corresponding one of the m columns of bit cells. There are m write drivers each coupled to a corresponding one of the m bit lines, wherein the m drivers each comprise a write one circuit and a write zero circuit. The m drivers are operable to write all ones into a row of bit cells in response to a first control signal coupled to the write one circuits and to write all zeros into a row of bit cells in response to a second control signal coupled to the write zero circuits.
Public/Granted literature
- US20140211576A1 Nonvolatile Logic Array with Built-In Test Drivers Public/Granted day:2014-07-31
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