Invention Grant
- Patent Title: Apparatus and methods for clock characterization
- Patent Title (中): 用于时钟表征的装置和方法
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Application No.: US13629919Application Date: 2012-09-28
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Publication No.: US08797082B2Publication Date: 2014-08-05
- Inventor: Ravi K. Ramaswami , Geertjan Joordens
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Agent Rory D. Rankin
- Main IPC: H03K3/00
- IPC: H03K3/00

Abstract:
A system and method for efficiently performing timing characterization of high-speed clocks signals with low-speed input/output pins. An integrated circuit includes a clock generator that generates a high-speed clock signal. A clock characterizer circuit receives the high-speed clock signal. The clock characterizer generates a corresponding low-speed clock signal. The generated low-speed clock signal is output through a low-speed general-purpose input/output (GPIO) pin for measurement. The generated low-speed clock signal is sent to a sequential element for staging. The staging of the generated low-speed clock signal is done with sequential elements that use a reverse polarity of a clock signal than the polarity used by a previous stage. The high-speed clock signal is used for the staging. The output of each stage is sent to a low-speed GPIO pin for measurement.
Public/Granted literature
- US20140091841A1 APPARATUS AND METHODS FOR CLOCK CHARACTERIZATION Public/Granted day:2014-04-03
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