Invention Grant
- Patent Title: Parallel test payload
- Patent Title (中): 并行测试有效载荷
-
Application No.: US13384951Application Date: 2010-01-29
-
Publication No.: US08797193B2Publication Date: 2014-08-05
- Inventor: Robert Alan Ulichney , Steven J. Simske , Matthew D. Gaubatz
- Applicant: Robert Alan Ulichney , Steven J. Simske , Matthew D. Gaubatz
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- International Application: PCT/US2010/022541 WO 20100129
- International Announcement: WO2011/093870 WO 20110804
- Main IPC: H03M7/40
- IPC: H03M7/40 ; H03M7/30
Abstract:
A parallel test payload includes a bit sequence configured to be segmented into a plurality of sub-sequences having variable bit length carriers. Respective carriers are represented uniformly in each one of the plurality of sub-sequences.
Public/Granted literature
- US20120281920A1 PARALLEL TEST PAYLOAD Public/Granted day:2012-11-08
Information query
IPC分类:
