发明授权
- 专利标题： Calibration method for radio frequency scattering parameter measurement applying three calibrators and measurement structure thereof
- 专利标题（中）： 使用三个校准器的射频散射参数测量的校准方法及其测量结构
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申请号： US13223410申请日： 2011-09-01
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公开(公告)号： US08798953B2公开(公告)日： 2014-08-05
- 发明人: Chien-Chang Huang
- 申请人： Chien-Chang Huang
- 申请人地址： TW Taoyuan County
- 专利权人： Yuan Ze University
- 当前专利权人： Yuan Ze University
- 当前专利权人地址： TW Taoyuan County
- 代理机构： Sinorica, LLC
- 代理商 Ming Chow
- 主分类号： G01R35/00
- IPC分类号： G01R35/00 ; G01R27/32
摘要：
A calibration method for radio frequency scattering parameter measurement applying three calibrators and measurement structure thereof, comprising a transmission line segment calibrator, an offset series device calibrator, an offset shunt device calibrator and a tested object measuring instrument, wherein the length of the transmission lines for the offset series device calibrator and the offset shunt device calibrator is equal to the one of the transmission line for the tested object measuring instrument such that the offset series device calibrator, the offset shunt device calibrator and the tested object measuring instrument have the identical error boxes, and after having acquired the scattering parameter matrix of the error box by means of the calibration method, it is possible to connect the tested electronic device onto the tested object measuring instrument and perform operations on uncorrected measurement data thereof thereby obtaining the radio frequency scattering parameter of the tested object.
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