发明授权
US08811767B2 Structured light for 3D shape reconstruction subject to global illumination
有权
用于3D形状重建的结构光,受全球照明影响
- 专利标题: Structured light for 3D shape reconstruction subject to global illumination
- 专利标题(中): 用于3D形状重建的结构光,受全球照明影响
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申请号: US13048019申请日: 2011-03-15
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公开(公告)号: US08811767B2公开(公告)日: 2014-08-19
- 发明人: Ashok Veeraraghavan , Mohit Gupta , Amit Agrawal
- 申请人: Ashok Veeraraghavan , Mohit Gupta , Amit Agrawal
- 申请人地址: US MA Cambridge
- 专利权人: Mitsubishi Electric Research Laboratories, Inc.
- 当前专利权人: Mitsubishi Electric Research Laboratories, Inc.
- 当前专利权人地址: US MA Cambridge
- 代理商 Dirk Brinkman; Gene Vinokur
- 主分类号: G06K9/40
- IPC分类号: G06K9/40 ; G06T7/00
摘要:
Depth values in a scene are measured by projecting sets of patterns on the scene, wherein each set of patterns is structured with different spatial frequency using different encoding functions. Sets of images of the scene is acquired, wherein there is one image for each pattern in each set. Depth values are determining for each pixel at corresponding locations in the sets of images. The depth values of each pixel are analyzed, and the depth value is returned if the depth values at the corresponding locations are similar. Otherwise, the depth value is marked as having an error.
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