Invention Grant
- Patent Title: Low profile ultrasound inspection scanner
- Patent Title (中): 低调超声波检查扫描仪
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Application No.: US13709668Application Date: 2012-12-10
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Publication No.: US08813567B2Publication Date: 2014-08-26
- Inventor: Jacques L. Brignac
- Applicant: ALSTOM Technology Ltd
- Applicant Address: CH Baden
- Assignee: ALSTOM Technology Ltd
- Current Assignee: ALSTOM Technology Ltd
- Current Assignee Address: CH Baden
- Main IPC: G01N29/04
- IPC: G01N29/04

Abstract:
An inspection scanner [1000] is described that has a low profile construction designed to fit into tight spaces and inspect structures [10] such as weld joints [13]. Wheel frame assemblies [1100, 1200] carry a probe holder assembly [1110] with an ultrasonic (US) array [1400] that emits US beams through the structure [10] and receives reflected sound waves. The probe holder assembly [1110] extends and US beam is angled away to inspect in tight locations. The wheel frame assemblies [1100, 1200] roll on wheels [1140, 1240] that drive an encoder [1250]. Encoder [1250] provides the specific locations for the received sound waves with respect to the weld. The locations and received sound waves are used to reconstruct a signal showing imperfections inside of structure [10]. The wheels [1140, 1240] may be magnetic to hold it to the structure [10] being inspected. A brake system [1600] may be employed to hold the inspection scanner [1000] at a given location.
Public/Granted literature
- US20130091951A1 LOW PROFILE ULTRASOUND INSPECTION SCANNER Public/Granted day:2013-04-18
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