Invention Grant
- Patent Title: Optoelectronic methods and devices for detection of analytes
- Patent Title (中): 用于检测分析物的光电方法和装置
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Application No.: US14043553Application Date: 2013-10-01
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Publication No.: US08817265B2Publication Date: 2014-08-26
- Inventor: John C. Hulteen , Kiran S. Kanukurthy , Neal A. Rakow , Andrzej F. Rybacha , Richard L. Rylander , Arthur Scheffler , Zeljko Zupanc
- Applicant: 3M Innovative Properties Company
- Applicant Address: US MN St. Paul
- Assignee: 3M Innovative Properties Company
- Current Assignee: 3M Innovative Properties Company
- Current Assignee Address: US MN St. Paul
- Agent Kenneth B. Wood
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01N21/78 ; G01N21/27
Abstract:
Herein are disclosed optoelectronic methods and devices for detecting the presence of an analyte. Such methods and devices may comprise at least one sensing element that is responsive to the presence of an analyte of interest and that may be interrogated optically by the use of at least one light source and at least one light detector.
Public/Granted literature
- US20140036270A1 OPTOELECTRONIC METHODS AND DEVICES FOR DETECTION OF ANALYTES Public/Granted day:2014-02-06
Information query
