发明授权
- 专利标题: Optical position-measuring device
- 专利标题(中): 光学位置测量装置
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申请号: US13061485申请日: 2009-07-08
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公开(公告)号: US08817272B2公开(公告)日: 2014-08-26
- 发明人: Michael Hermann
- 申请人: Michael Hermann
- 申请人地址: DE Traunreut
- 专利权人: Dr. Johnannes Heidenhein GmbH
- 当前专利权人: Dr. Johnannes Heidenhein GmbH
- 当前专利权人地址: DE Traunreut
- 代理机构: Kenyon & Kenyon LLP
- 优先权: DE102008044858 20080828
- 国际申请: PCT/EP2009/058667 WO 20090708
- 国际公布: WO2010/023017 WO 20100304
- 主分类号: G01B11/14
- IPC分类号: G01B11/14 ; G01D5/38
摘要:
An optical position-measuring device for detecting the position of two objects movable relative to each other in at least one measuring direction includes a measuring standard which is joined to one of the two objects and possesses an incremental graduation extending in the measuring direction, as well as at least one reference marking at a reference position. The reference marking includes two reference-marking subfields disposed in mirror symmetry with respect to a reference-marking axis of symmetry, each of the subfields being made up of a structure extending in the measuring direction and having a locally changeable graduation period. In addition, the position-measuring device has a scanning unit which is joined to the other of the two objects and to which a scanning device is assigned that is used to generate at least one reference signal at the reference position. The scanning device includes at least one light source emitting divergently in the direction of the measuring standard, as well as a detector system having elements which are disposed along the measuring direction such that, starting from a central detector-system axis of symmetry in the measuring direction, the center-to-center distances between adjacent elements in the same direction change like the graduation periods of the structures in the reference-marking subfields starting from the reference-marking axis of symmetry.
公开/授权文献
- US20110188055A1 Optical Position-Measuring Device 公开/授权日:2011-08-04
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