发明授权
- 专利标题: Method for providing an ordered layer of self-assemblable polymer for use in lithography
- 专利标题(中): 提供用于光刻的自组装聚合物的有序层的方法
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申请号: US13640293申请日: 2011-01-19
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公开(公告)号: US08822139B2公开(公告)日: 2014-09-02
- 发明人: Emiel Peeters , Sander Frederik Wuister , Roelof Koole
- 申请人: Emiel Peeters , Sander Frederik Wuister , Roelof Koole
- 申请人地址: NL Veldhoven
- 专利权人: ASML Netherlands B.V.
- 当前专利权人: ASML Netherlands B.V.
- 当前专利权人地址: NL Veldhoven
- 代理机构: Pillsbury Winthrop Shaw Pittman LLP
- 国际申请: PCT/EP2011/050668 WO 20110119
- 国际公布: WO2011/128120 WO 20111020
- 主分类号: G03F7/26
- IPC分类号: G03F7/26 ; B29C59/00 ; C08G83/00 ; B82Y40/00 ; B82Y10/00 ; G03F7/00
摘要:
A method for providing an ordered polymer layer at a surface of a substrate includes depositing a self-assemblable polymer layer directly onto a primer layer on a substrate to provide an interface between the self-assemblable polymer layer and the primer layer, and treating the self-assemblable polymer layer to provide self-assembly into an ordered polymer layer, such as a block copolymer, having first and second domain types at the interface. The primer layer is adapted to improve its chemical affinity to each domain type at the interface, in response to the presence of the respective domain type in the self-assembled polymer at the interface during the self-assembly of the self-assemblable polymer layer into the ordered polymer layer. This may lead to reduction in defect levels and/or improved persistence length for the ordered polymer layer. The method may be useful for forming resist layers for use in device lithography.
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