Invention Grant
- Patent Title: Charged particle beam irradiation apparatus
- Patent Title (中): 带电粒子束照射装置
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Application No.: US13939914Application Date: 2013-07-11
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Publication No.: US08822965B2Publication Date: 2014-09-02
- Inventor: Toru Asaba
- Applicant: Sumitomo Heavy Industries, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Sumitomo Heavy Industries, Ltd.
- Current Assignee: Sumitomo Heavy Industries, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Rader, Fishman & Grauer PLLC
- Priority: JP2012-156669 20120712
- Main IPC: H01J3/08
- IPC: H01J3/08 ; H05H7/12 ; H05H7/00
Abstract:
A charged particle beam irradiation apparatus includes: a scanning electromagnet that scans a charged particle beam; and a degrader that is provided on a downstream side of the scanning electromagnet in a scanning direction of the charged particle beam and adjusts a range of the charged particle beam by reducing energy of the charged particle beam. The degrader is configured to be closer to an upstream side in the scanning direction of the charged particle beam, outward in the scanning direction.
Public/Granted literature
- US20140014851A1 CHARGED PARTICLE BEAM IRRADIATION APPARATUS Public/Granted day:2014-01-16
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