发明授权
US08826202B1 Reducing design verification time while maximizing system functional coverage
有权
减少设计验证时间,同时最大化系统功能覆盖
- 专利标题: Reducing design verification time while maximizing system functional coverage
- 专利标题(中): 减少设计验证时间,同时最大化系统功能覆盖
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申请号: US13890732申请日: 2013-05-09
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公开(公告)号: US08826202B1公开(公告)日: 2014-09-02
- 发明人: Sandeep Kumar Goel , Ashok Mehta
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW
- 代理机构: Lowe Hauptman & Ham, LLP
- 主分类号: G06F17/50
- IPC分类号: G06F17/50 ; G06F9/455 ; G06F11/22
摘要:
A system for functional verification of a chip design includes the chip design, a test generator, a test bench, a verification tool, and a coverage tool. The coverage tool is configured to receive chip design, user input, and coverage files from the verification tool to generate information for the test generator to improve the test coverage of the verification tool. The method includes receiving a chip design, functionally testing the chip design, generating coverage files, receiving user options, including a coverage basis, a report basis, and a defined coverage, calculating coverage impact and new overall coverage using the defined coverage and coverage files, and ranking each report basis according to coverage impact of each coverage basis.
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