Invention Grant
US08826206B1 Testing two-state logic power island interface 有权
测试两状态逻辑电源岛接口

Testing two-state logic power island interface
Abstract:
An aspect includes a computer program product for implementing a model of an electrical circuit including a first region and a second region, the first region including simulated logic and a simulated latch circuit. The computer program product includes a tangible storage medium readable by a processing circuit for performing a method. The method includes receiving, as simulated logical inputs to the simulated logic a simulated power supply voltage state of the first region, a simulated data input signal and a simulated clock signal. The method also includes generating, based on determining that the simulated power supply voltage state of the first region corresponds to an inactive state of the first region, a pseudo-random number as an output of the simulated latch circuit, the pseudo-random number generated based on the simulated data input signal and the simulated data output signal from the simulated latch circuit.
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