发明授权
- 专利标题: Machine calibration artifact
- 专利标题(中): 机器校准工件
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申请号: US13325984申请日: 2011-12-14
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公开(公告)号: US08826719B2公开(公告)日: 2014-09-09
- 发明人: Wilhelmus Weekers , John Langlais , David Harvey , Peter Hicks
- 申请人: Wilhelmus Weekers , John Langlais , David Harvey , Peter Hicks
- 申请人地址: US RI North Kingstown
- 专利权人: Hexagon Metrology, Inc.
- 当前专利权人: Hexagon Metrology, Inc.
- 当前专利权人地址: US RI North Kingstown
- 代理机构: Wolf, Greenfield & Sacks, P.C.
- 主分类号: G01B1/00
- IPC分类号: G01B1/00 ; G01B3/30 ; G01B21/04
摘要:
A calibration artifact includes an elongated body made substantially entirely of ceramic material and having a direction of elongation. A plurality of measurement elements comprising the ceramic material are integrally formed with the elongated body, each measurement element comprising a first planar measurement surface facing in a first direction. The first planar measurement surface of each measurement element is parallel to the first planar measurement surface of each of the other measurement elements of the plurality of measurement elements. The calibration artifact may be a unitary step gauge formed with a single piece of ceramic material.
公开/授权文献
- US20120151988A1 MACHINE CALIBRATION ARTIFACT 公开/授权日:2012-06-21
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