Invention Grant
- Patent Title: Apparatus and method for measuring capacitance in touch sensor
- Patent Title (中): 用于测量触摸传感器电容的装置和方法
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Application No.: US13280079Application Date: 2011-10-24
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Publication No.: US08829927B2Publication Date: 2014-09-09
- Inventor: Tae Gyu Kim
- Applicant: Tae Gyu Kim
- Applicant Address: KR Yongin-Si
- Assignee: Zinitix Co., Ltd.
- Current Assignee: Zinitix Co., Ltd.
- Current Assignee Address: KR Yongin-Si
- Main IPC: G01R27/26
- IPC: G01R27/26 ; H03K17/96 ; G06F3/044

Abstract:
An apparatus and method are provided to rapidly and accurately measure the variation of capacitance in a panel load of a touch sensor and thus increase touch sensitivity and noise resistance. The apparatus includes a panel driver configured to drive a panel load in the touch sensor according to a reference voltage, and a capacitive load detector configured to measure capacitance of the panel load by sensing a panel load driving current that is applied to the panel load by the panel driver.
Public/Granted literature
- US20130099804A1 APPARATUS AND METHOD FOR MEASURING CAPACITANCE IN TOUCH SENSOR Public/Granted day:2013-04-25
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