Invention Grant
US08829927B2 Apparatus and method for measuring capacitance in touch sensor 有权
用于测量触摸传感器电容的装置和方法

  • Patent Title: Apparatus and method for measuring capacitance in touch sensor
  • Patent Title (中): 用于测量触摸传感器电容的装置和方法
  • Application No.: US13280079
    Application Date: 2011-10-24
  • Publication No.: US08829927B2
    Publication Date: 2014-09-09
  • Inventor: Tae Gyu Kim
  • Applicant: Tae Gyu Kim
  • Applicant Address: KR Yongin-Si
  • Assignee: Zinitix Co., Ltd.
  • Current Assignee: Zinitix Co., Ltd.
  • Current Assignee Address: KR Yongin-Si
  • Main IPC: G01R27/26
  • IPC: G01R27/26 H03K17/96 G06F3/044
Apparatus and method for measuring capacitance in touch sensor
Abstract:
An apparatus and method are provided to rapidly and accurately measure the variation of capacitance in a panel load of a touch sensor and thus increase touch sensitivity and noise resistance. The apparatus includes a panel driver configured to drive a panel load in the touch sensor according to a reference voltage, and a capacitive load detector configured to measure capacitance of the panel load by sensing a panel load driving current that is applied to the panel load by the panel driver.
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