发明授权
- 专利标题： Pseudo dual-energy material identification system and method with undersampling
- 专利标题（中）： 伪双能量材料识别系统和欠采样方法
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申请号： US13322242申请日： 2009-12-30
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公开(公告)号： US08831305B2公开(公告)日： 2014-09-09
- 发明人: Li Zhang , Zhiqiang Chen , Yuanyuan Liu , Yuxiang Xing , Ziran Zhao
- 申请人： Li Zhang , Zhiqiang Chen , Yuanyuan Liu , Yuxiang Xing , Ziran Zhao
- 申请人地址： CN Beijing CN Beijing
- 专利权人： Tsinghua University,Nuctech Company Limited
- 当前专利权人： Tsinghua University,Nuctech Company Limited
- 当前专利权人地址： CN Beijing CN Beijing
- 代理机构： Westman, Champlin & Koehler, P.A.
- 优先权： CN200910085924 20090527
- 国际申请： PCT/CN2009/076297 WO 20091230
- 国际公布： WO2010/135901 WO 20101202
- 主分类号： G06K9/00
- IPC分类号： G06K9/00 ; G01N23/087 ; A61B6/03 ; G06T11/00 ; A61B6/00
摘要：
Pseudo dual-energy material identification systems and methods with under-sampling are disclosed. The system comprises a ray generating device, a mechanic rotation control section, a data collecting subsystem comprising a first tier of detectors and a second tier of detectors, and a master control and data processing computer. The system utilizes a CT-imaging-based material identification method with under-sampled dual-energy projection data, in which only a few detectors at the second tier are used to perform dual-energy projection data sampling, and optimization is made on the procedure of solving an equation system.