发明授权
- 专利标题: X-ray examination device and method
- 专利标题(中): X射线检查装置及方法
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申请号: US13386906申请日: 2010-07-20
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公开(公告)号: US08842805B2公开(公告)日: 2014-09-23
- 发明人: Roland Proksa
- 申请人: Roland Proksa
- 申请人地址: NL Eindhoven
- 专利权人: Koninklijke Philips N.V.
- 当前专利权人: Koninklijke Philips N.V.
- 当前专利权人地址: NL Eindhoven
- 优先权: EP09166693 20090729
- 国际申请: PCT/IB2010/053304 WO 20100720
- 国际公布: WO2011/013031 WO 20110203
- 主分类号: A61B6/03
- IPC分类号: A61B6/03 ; A61B6/00 ; G01T1/17
摘要:
The present invention relates to an X-ray examination device and a corresponding method. A fast and periodical modulation of the X-ray flux within each detection interval is performed having a low X-ray flux at the beginning of the detection interval to ensure that no detection channel is overloaded. With increasing the X-ray flux particularly the peripheral detection channels will rum into saturation, which is detected. A saturated detector channel is stopped from further detecting radiation, and the time of effective radiation detection without saturation is measured for correcting those detection signals. From all detection signals, after any correction of detection signals from saturated detection channels, an X-ray image can be reconstructed.
公开/授权文献
- US20120121063A1 X-RAY EXAMINATION DEVICE AND METHOD 公开/授权日:2012-05-17