Invention Grant
- Patent Title: Profiling-based scan chain diagnosis
- Patent Title (中): 基于分析的扫描链诊断
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Application No.: US13158743Application Date: 2011-06-13
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Publication No.: US08843796B2Publication Date: 2014-09-23
- Inventor: Wu-Tung Cheng , Yu Huang
- Applicant: Wu-Tung Cheng , Yu Huang
- Applicant Address: US OR Wilsonville
- Assignee: Mentor Graphics Corporation
- Current Assignee: Mentor Graphics Corporation
- Current Assignee Address: US OR Wilsonville
- Agency: Klarquist Sparkman, LLP
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/3185 ; G01R31/3183
Abstract:
With various implementations of the invention, unloading masking information for each of the scan patterns is first determined. A tester then applies the scan patterns to a circuit under test and collects test response data according to the unloading masking information. A profiling-based analysis is performed to determine failing scan cell information based on the test response data.
Public/Granted literature
- US20110307751A1 Profiling-Based Scan Chain Diagnosis Public/Granted day:2011-12-15
Information query
