Invention Grant
- Patent Title: Micrometer
- Patent Title (中): 千分尺
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Application No.: US13651784Application Date: 2012-10-15
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Publication No.: US08844153B2Publication Date: 2014-09-30
- Inventor: Shuji Hayashida
- Applicant: Mitutoyo Corporation
- Applicant Address: JP Kanagawa
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Oliff PLC
- Priority: JP2011-228997 20111018
- Main IPC: G01B3/18
- IPC: G01B3/18

Abstract:
A micrometer includes: a displacement detector that detects a displacement of a spindle; a display device that is rotatably attached to a fixed sleeve; and a control device that controls the display device. The display device includes: an image display section that displays an image including a measurement value based on the displacement detected by the displacement detector; a surface member that faces the image display section and has a touch surface; a position sensor that detects a position pressed on the touch surface; and a support member that supports the image display section, the surface member and the position sensor while the touch surface is exposed to an outside, the support member being rotatably attached to the fixed sleeve.
Public/Granted literature
- US20130091720A1 MICROMETER Public/Granted day:2013-04-18
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