Invention Grant
- Patent Title: Analysis apparatus and method to analyze a printed circuit board
- Patent Title (中): 分析印刷电路板的分析装置和方法
-
Application No.: US12628336Application Date: 2009-12-01
-
Publication No.: US08850382B2Publication Date: 2014-09-30
- Inventor: Hideharu Matsushita , Akira Ueda
- Applicant: Hideharu Matsushita , Akira Ueda
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2008-306978 20081202
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F11/22

Abstract:
An analysis apparatus for a printed circuit board. The analysis apparatus includes a processor that executes a process of rewriting physical property data of a wiring layer of a printed circuit board to a value. The value is based on physical property data of an electronic part having a heat-generating attribute. The electronic part is mounted on the portion of the wiring layer. The analysis apparatus converts the physical property data of the portion of the wiring layer that has the electronic part to physical property data of an insulating layer of the printed circuit board.
Public/Granted literature
- US20100138799A1 ANALYSIS APPARATUS Public/Granted day:2010-06-03
Information query