Invention Grant
- Patent Title: Test fixture for strip samples
- Patent Title (中): 测试夹具用于条带样品
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Application No.: US13605543Application Date: 2012-09-06
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Publication No.: US08850898B2Publication Date: 2014-10-07
- Inventor: David J. Johnsen
- Applicant: David J. Johnsen
- Applicant Address: US PA Berwyn
- Assignee: ADC Telecommunications, Inc.
- Current Assignee: ADC Telecommunications, Inc.
- Current Assignee Address: US PA Berwyn
- Agency: Merchant & Gould P.C.
- Main IPC: G01N3/20
- IPC: G01N3/20 ; G01N3/04 ; G01N3/02

Abstract:
A test fixture for applying a prescribed displacement to a material includes a first and a second portion, a first and a second adjustable pin, and an actuator. The first portion includes a first pin that to engages the material at a first location on the material. A second pin is engages the material at a second location on the material. A third pin engages the material at a third location on the material. The first adjustable pin holds the material against the second pin at the second location. The second adjustable pin holds the material against the third pin at the third location. The actuator is adapted to configure a relative position between the first pin and the second and third pins.
Public/Granted literature
- US20130145859A1 Test Fixture for Strip Samples Public/Granted day:2013-06-13
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