Invention Grant
US08851105B2 Mass flow meter, mass flow controller, mass flow meter system and mass flow control system containing the mass flow meter and the mass flow controller
有权
质量流量计,质量流量控制器,质量流量计系统和包含质量流量计和质量流量控制器的质量流量控制系统
- Patent Title: Mass flow meter, mass flow controller, mass flow meter system and mass flow control system containing the mass flow meter and the mass flow controller
- Patent Title (中): 质量流量计,质量流量控制器,质量流量计系统和包含质量流量计和质量流量控制器的质量流量控制系统
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Application No.: US12722570Application Date: 2010-03-12
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Publication No.: US08851105B2Publication Date: 2014-10-07
- Inventor: Toshihiro Kashima , Yutaka Yoneda , Yasuhiro Isobe
- Applicant: Toshihiro Kashima , Yutaka Yoneda , Yasuhiro Isobe
- Applicant Address: JP
- Assignee: Horiba Stec, Co., Ltd.
- Current Assignee: Horiba Stec, Co., Ltd.
- Current Assignee Address: JP
- Agency: Cantor Colburn LLP
- Priority: JP2009-060319 20090312
- Main IPC: G01F5/00
- IPC: G01F5/00 ; G05D7/06 ; G01F1/684 ; G01F25/00

Abstract:
An object of this invention is to provide a superior mass flow meter or the like that can flexibly cope with a change of a sample fluid such as a gas kind without requiring a special troublesome labor and that can measure a flow rate with high accuracy. The mass flow meter comprises a sensor section that detects a flow rate of a sample fluid flowing in a flow channel, a setting section that sets a flow rate characteristic function that is intrinsic to each fluid to determine a flow rate based on a flow rate detected value output by the sensor section and an instrumental error correction parameter that is independent from the flow rate characteristic function and common to multiple sample fluids to correct an instrumental error of each mass flow meter, and a flow rate calculating section that calculates a flow rate measurement value of the sample fluid by applying the flow rate characteristic function and the instrumental error correction parameter to the flow rate detected value.
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