Invention Grant
- Patent Title: Substrate processing apparatus and method of manufacturing semiconductor device
- Patent Title (中): 基板处理装置及半导体装置的制造方法
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Application No.: US12363059Application Date: 2009-01-30
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Publication No.: US08851886B2Publication Date: 2014-10-07
- Inventor: Shinya Morita , Akihiro Sato , Akinori Tanaka , Shigeo Nakada , Takayuki Nakada , Shuhei Saido , Tomoyuki Matsuda
- Applicant: Shinya Morita , Akihiro Sato , Akinori Tanaka , Shigeo Nakada , Takayuki Nakada , Shuhei Saido , Tomoyuki Matsuda
- Applicant Address: JP Tokyo
- Assignee: Hitachi Kokusai Electric, Inc.
- Current Assignee: Hitachi Kokusai Electric, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Brundidge & Stanger, P.C.
- Priority: JP2008-022541 20080201
- Main IPC: F27D1/18
- IPC: F27D1/18 ; C23C16/44 ; C23C16/455 ; H01L21/67

Abstract:
Provided is a substrate processing apparatus. The substrate processing apparatus includes a reaction tube; a heating device configured to heat the reaction tube; and a manifold installed outward as compared with the heating device and made of a non-metallic material. A first thickness of the manifold defined in a direction perpendicular to a center axis of the reaction tube is greater than a second thickness of the manifold defined at a position adjacent to the reaction tube in a direction parallel to the center axis of the reaction tube. The manifold includes a protrusion part of which at least a portion protrudes inward more than an inner wall of the reaction tube, and a gas supply unit disposed at at least the protrusion part for supplying gas to an inside of the reaction tube.
Public/Granted literature
- US20090197409A1 SUBSTRATE PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2009-08-06
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