Invention Grant
- Patent Title: Multilayer analysis element for analyzing liquid samples
- Patent Title (中): 用于分析液体样品的多层分析元件
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Application No.: US11661786Application Date: 2005-07-11
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Publication No.: US08852515B2Publication Date: 2014-10-07
- Inventor: Hideaki Tanaka
- Applicant: Hideaki Tanaka
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2004-271352 20040917
- International Application: PCT/JP2005/012782 WO 20050711
- International Announcement: WO2006/030579 WO 20060323
- Main IPC: G01N21/75
- IPC: G01N21/75 ; G01N31/22 ; G01N21/78 ; G01N33/48 ; G01N33/487 ; G01N33/497

Abstract:
The problem is to provide a multilayer analysis element for analyzing liquid samples, having improved adhesive force between a transparent support and a detection layer even by handling at the time of processing, while maintaining basic performances such as sensitivity and storage performance. The multilayer analysis element for analyzing liquid samples is characterized in that at least a detection layer containing a substance that generates a detectable change by a gaseous substance, a liquid blocking layer that selectively permeates the gaseous substance, and a spreading layer are integrally adhesion laminated in this order on a transparent support, and the detection layer contains an adhesive polymer and a water-insoluble vinyl polymer.
Public/Granted literature
- US20070258860A1 Multilayer Analysis Element for Analyzing Liquid Samples Public/Granted day:2007-11-08
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