Invention Grant
- Patent Title: Automated analyzer
- Patent Title (中): 自动分析仪
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Application No.: US13039949Application Date: 2011-03-03
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Publication No.: US08852530B2Publication Date: 2014-10-07
- Inventor: Takehiko Oonuma , Tomohiro Sugimura
- Applicant: Takehiko Oonuma , Tomohiro Sugimura
- Applicant Address: JP Tokyo JP Otawara-shi
- Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee Address: JP Tokyo JP Otawara-shi
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2010-049222 20100305
- Main IPC: G01N1/10
- IPC: G01N1/10 ; G01N35/10

Abstract:
An automated analyzer according to an embodiment includes a probe. The probe has a step part configured to be provided between a lower shaft and an upper shaft, and to be formed such that the outer diameter changes. A descending controller lowers the probe from a predefined position that positions the step part above the liquid surface to an operating position that positions the step part below the liquid surface. A ascending controller raises the probe at a high speed from the operating position until immediately before the step part reaches the position of the liquid surface, subsequently raises the probe at a low speed until the step part passes through the liquid surface, and raises the probe at a higher speed than the low speed from immediately after the step part passes through the position of the liquid surface up to the predefined position.
Public/Granted literature
- US20110223061A1 AUTOMATED ANALYZER Public/Granted day:2011-09-15
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