Invention Grant
- Patent Title: High voltage device
- Patent Title (中): 高压设备
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Application No.: US13352248Application Date: 2012-01-17
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Publication No.: US08853022B2Publication Date: 2014-10-07
- Inventor: Guowei Zhang
- Applicant: Guowei Zhang
- Applicant Address: SG Singapore
- Assignee: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Current Assignee: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Horizon IP Pte. Ltd.
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
A method of forming a device is presented. The method includes providing a substrate having a device region which includes a source region, a gate and a drain region defined thereon. The method also includes implanting the gate. The gate comprises one or more doped portions with different dopant concentrations. A source and a drain are formed in the source region and drain region. The drain is separated from the gate on a second side of the gate and the source is adjacent to a first side of the gate.
Public/Granted literature
- US20130181286A1 HIGH VOLTAGE DEVICE Public/Granted day:2013-07-18
Information query
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