A test card includes a substrate and a goldfinger structure disposed on a side of the substrate. The goldfinger structure includes a first conductive section and a second conductive section. The first conductive section is inserted into a slot of a socket for electrically connecting to the socket. The second conductive section is connected to the first conductive section in a separable manner, and the second conductive section is inserted into the slot of the socket for electrically connecting to the socket after the first conductive section is cut for separating from the second conductive section.