Invention Grant
- Patent Title: Tandem mass spectrometer
- Patent Title (中): 串联质谱仪
-
Application No.: US11703898Application Date: 2007-02-07
-
Publication No.: US08853622B2Publication Date: 2014-10-07
- Inventor: Michael W. Senko
- Applicant: Michael W. Senko
- Applicant Address: US CA San Jose
- Assignee: Thermo Finnigan LLC
- Current Assignee: Thermo Finnigan LLC
- Current Assignee Address: US CA San Jose
- Agent Charles B. Katz
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/42

Abstract:
A tandem mass spectrometer includes a two-dimensional ion trap that has an elongated ion-trapping region extending along a continuously curving path between first and second opposite ends thereof. The elongated trapping region has a central axis that is defined substantially parallel to the curved path and that extends between the first and second opposite ends. The two-dimensional ion trap is configured for receiving ions through the first end and for mass selectively ejecting the ions along a direction that is orthogonal to the central axis, such that the ejected ions are directed generally toward a common point. The tandem mass spectrometer also includes a collision cell having an ion inlet that is disposed about the common point for receiving the ions that are ejected therefrom and for causing at least a portion of the ions to undergo collisions and form product ions by fragmentation. A mass analyzer in communication with the collision cell receives the product ions from the collision cell and obtains product ion mass spectra with a rapid scan rate. In this way, a plurality of product ion spectra may be obtained for a large number of precursor ions in a sample without the need for data-dependent operation.
Public/Granted literature
- US20080185511A1 Tandem mass spectrometer Public/Granted day:2008-08-07
Information query