Invention Grant
- Patent Title: Ionization apparatus and ionization analysis apparatus
- Patent Title (中): 电离装置和电离分析装置
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Application No.: US14172400Application Date: 2014-02-04
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Publication No.: US08853626B2Publication Date: 2014-10-07
- Inventor: Kenzo Hiraoka , Lee Chuin Chen
- Applicant: University of Yamanashi
- Applicant Address: JP Yamanashi
- Assignee: University of Yamanashi
- Current Assignee: University of Yamanashi
- Current Assignee Address: JP Yamanashi
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2010-029157 20100212
- Main IPC: H01J49/10
- IPC: H01J49/10 ; H01J49/00 ; H01J27/00 ; G01N27/68 ; H01J49/14 ; H05H1/24

Abstract:
A sampling nozzle 21, an ion supply tube 31 leading to an analysis apparatus 50 and a barrier discharge tube 11 are connected to first, second and third ends, respectively, of a T-shaped tube 41 having three connecting ports, and the central portion of the T-shaped tube is an ionization chamber SP. The ionization chamber SP is a closed space, and ions generated therein are introduced to the analysis apparatus 50 through the ion supply tube 31. As a result, almost all of the ions are introduced into the interior of the analysis apparatus.
Public/Granted literature
- US20140151550A1 Ionization Apparatus and Ionization Analysis Apparatus Public/Granted day:2014-06-05
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