Invention Grant
- Patent Title: System, structure, and method of manufacturing a semiconductor substrate stack
- Patent Title (中): 制造半导体衬底叠层的系统,结构和方法
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Application No.: US12178021Application Date: 2008-07-23
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Publication No.: US08853830B2Publication Date: 2014-10-07
- Inventor: Hung-Pin Chang , Weng-Jin Wu , Wen-Chih Chiou , Chen-Hua Yu
- Applicant: Hung-Pin Chang , Weng-Jin Wu , Wen-Chih Chiou , Chen-Hua Yu
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater and Matsil, L.L.P.
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/538 ; H01L25/00 ; H01L23/48 ; H01L25/065

Abstract:
A method of manufacturing a semiconductor substrate structure for use in a semiconductor substrate stack system is presented. The method includes a semiconductor substrate which includes a front-face, a backside, a bulk layer, an interconnect layer that includes a plurality of inter-metal dielectric layers sandwiched between conductive layers, a contact layer that is between the bulk layer and the interconnect layer, and a TSV structure commencing between the bulk layer and the contact layer and terminating at the backside of the substrate. The TSV structure is electrically coupled to the interconnect layer and the TSV structure is electrically coupled to a bonding pad on the backside.
Public/Granted literature
- US20090283871A1 System, Structure, and Method of Manufacturing a Semiconductor Substrate Stack Public/Granted day:2009-11-19
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