Invention Grant
- Patent Title: Method and device for frequency response measurement
- Patent Title (中): 用于频率响应测量的方法和装置
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Application No.: US13177961Application Date: 2011-07-07
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Publication No.: US08854030B2Publication Date: 2014-10-07
- Inventor: Olev Märtens , Mart Minn , Raul Land , Paul Annus , Tõnis Saar , Marko Reidla
- Applicant: Olev Märtens , Mart Minn , Raul Land , Paul Annus , Tõnis Saar , Marko Reidla
- Applicant Address: EE Tallinn EE Tallinn
- Assignee: Tallinn University of Technology,OÜ ELIKO Technoloogia Arenduskeskus
- Current Assignee: Tallinn University of Technology,OÜ ELIKO Technoloogia Arenduskeskus
- Current Assignee Address: EE Tallinn EE Tallinn
- Agency: Maine Cernota & Rardin
- Main IPC: G01R23/02
- IPC: G01R23/02 ; G01R31/3163

Abstract:
A method is provided for measuring a frequency response of an object, the method involving: generating an excitation signal having relatively fast changing frequency, defined by a time-domain function; generating at least one reference signal, having a waveform corresponding to the excitation signal; introducing the excitation signal into the object, receiving a response signal from the object; analyzing said response signal in a signal analyzer by correlating the response signal with at least one reference signal during a relatively short sliding time-domain window.
Public/Granted literature
- US20120007583A1 METHOD AND DEVICE FOR FREQUENCY RESPONSE MEASUREMENT Public/Granted day:2012-01-12
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