Invention Grant
- Patent Title: Integrated system including signal analysis circuit
- Patent Title (中): 集成系统包括信号分析电路
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Application No.: US13401947Application Date: 2012-02-22
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Publication No.: US08854051B2Publication Date: 2014-10-07
- Inventor: Soo Yong Kim , Xuezhen Mao
- Applicant: Soo Yong Kim , Xuezhen Mao
- Applicant Address: KR Suwon-Si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si, Gyeonggi-do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2011-0015683 20110222
- Main IPC: G01R27/28
- IPC: G01R27/28 ; G01R31/28
Abstract:
An integrated system is provided. The integrated system includes a control system and a signal analysis circuit configured to provide a test signal having a frequency to the control system, receive a feedback signal from the control system, and analyze the test signal and the feedback signal to generate a transfer function of the control system.
Public/Granted literature
- US20120212237A1 INTEGRATED SYSTEM INCLUDING SIGNAL ANALYSIS CIRCUIT Public/Granted day:2012-08-23
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